UPCOMING CONFERENCES & IMA MEETINGS

 

IMA Meeting at
8th European AEC/APC Conference
Dresden, Germany, Friday April 20, 2007

IMA Meeting Agenda

• 14:00 Introductions and IMA Overview John Pace/IMA President/PDF Solutions
• 14:15 Standards Update Brad Van Eck/ISMI-SEMATECH
• 14:45 ITRS FI Section Impact Update James Moyne/University of Michigan
• 15:30 Break
• 15:45 Process Control Systems SEMI Standard (PCS) James Moyne/University of Michigan
• 16:15 Metrology for Nanoelectronics: Metrology Roadmap Alain Diebold/SEMATECH
• 16:45 Q & A
• 17:00 Adjourn